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Jan-Hein Egbers

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2000 – 2009

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2002
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Sudha Gopalan, Benno H. Krabbenborg, Jan-Hein Egbers, Bart van Velzen, Rene Zingg:
Reliability of power transistors against application driven temperature swings. Microelectron. Reliab. 42(9-11): 1623-1628 (2002)

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