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Farzad Zarrinfar

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1990 – 1999

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1998
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Meh-Ron Amerian, William D. Atwell Jr., Ian Burgess, Gary D. Fleeman, David Y. Lepejian, T. W. Williams, Farzad Zarrinfar, Yervant Zorian:
A D&T Roundtable: Testing Mixed Logic and DRAM Chips. IEEE Des. Test Comput. 15(2): 86-92 (1998)
1994
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Farzad Zarrinfar:
Economics of "design for test" to remain competitive in the 90s. J. Electron. Test. 5(2-3): 171-177 (1994)

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