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J. G. A. Theeven

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2007
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M. A. Matin, J. G. A. Theeven, W. P. Vellinga, Marc G. D. Geers:
Correlation between localized strain and damage in shear-loaded Pb-free solders. Microelectron. Reliab. 47(8): 1262-1272 (2007)

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