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E. Sciacca

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2007
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Domenico Corso, S. Aurite, E. Sciacca, D. Naso, Salvatore Lombardo, A. Santangelo, M. C. Nicotra, S. Cascino:
Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage. Microelectron. Reliab. 47(4-5): 806-809 (2007)

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