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ORCIDFidel Muradali
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2000 – 2009
- 2008
[c17]Fidel Muradali, Suzanne Huh, Madhavan Swaminathan:
Load-Board/PCB Noise Suppression via Electromagnetic Band Gap Power Plane Patterning. ATS 2008: 195- 2007
- [c16]Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera:
Test Roles in Diagnosis and Silicon Debug. ATS 2007: 367 - [c15]Fidel Muradali, Jochen Rivoir:
Special Session: Analog Production Test. ATS 2007: 523 - 2006
- [c14]Fidel Muradali:
Practical Needs and Wants for Silicon Debug and Diagnosis. ATS 2006: 135 - 2005
- [c13]Fidel Muradali:
Business constraints drive test decisions. ITC 2005: 1 - 2004
- [j2]Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li:
ITC 2003 panels: Part 2. IEEE Des. Test Comput. 21(3): 175-176, 261-262 (2004) - [c12]Robert C. Aitken, Fidel Muradali:
From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions. DATE 2004: 2 - 2003
- [c11]Fidel Muradali:
Future ATE: Perspectives & Requirements. ITC 2003: 1297 - [c10]Fidel Muradali:
Diagnosis in Modern Design - Just the Tip of the Iceberg. ITC 2003: 1302 - 2002
- [c9]Fidel Muradali:
The Impact of Outsourcing on Test. ITC 2002: 1216 - [c8]Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song:
Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? VTS 2002: 175-176 - [c7]Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark:
Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer? VTS 2002: 445-446 - 2001
- [c6]Chintan Patel, Fidel Muradali, James F. Plusquellic:
Power supply transient signal integration circuit. ITC 2001: 704-712 - 2000
- [c5]Fidel Muradali, André Ivanov:
Do I Need this Tool for My Chips to Work? VTS 2000: 471-472
1990 – 1999
- 1999
- [c4]Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali:
Defect detection using power supply transient signal analysis. ITC 1999: 67-76 - [c3]Robert C. Aitken, Fidel Muradali:
Trends in SLI design and their effect on test. ITC 1999: 628-637 - 1996
- [c2]Fidel Muradali, Janusz Rajski:
A self-driven test structure for pseudorandom testing of non-scan sequential circuits. VTS 1996: 17-25 - 1995
- [j1]Fidel Muradali, Takao Nishida, Tsuguo Shimizu:
A structure and technique for pseudorandom-based testing of sequential circuits. J. Electron. Test. 6(1): 107-115 (1995) - 1990
- [c1]Fidel Muradali, Vinod K. Agarwal, Benoit Nadeau-Dostie:
A new procedure for weighted random built-in self-test. ITC 1990: 660-669
Coauthor Index
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