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Craig A. Gaw

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2000 – 2009

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2008
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Craig A. Gaw, Thomas Arnold, Karen Moore:
Intrinsic reliability of a 12 V field plate pHEMT. Microelectron. Reliab. 48(7): 974-984 (2008)
2007
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Craig A. Gaw, Thomas Arnold, Elizabeth Glass, Robert Martin:
Reliability and performance of a true enhancement mode HIGFET for wireless applications. Microelectron. Reliab. 47(8): 1180-1187 (2007)
2006
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Craig A. Gaw, Thomas Arnold, Robert Martin, Lisa Zhang, Dragan Zupac:
Evaluation of SiGe: C HBT intrinsic reliability using conventional and step stress methodologies. Microelectron. Reliab. 46(8): 1272-1278 (2006)

1980 – 1989

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1983
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Basil W. Hakki, Walter R. Holbrook, Craig A. Gaw:
High-frequency impedance of proton-bombarded injection lasers. Bell Syst. Tech. J. 62(2): 463-475 (1983)

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