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Langis Roy
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2020 – today
- 2024
- [j8]Wing Yi Pao, Joshua Howorth, Long Li, Martin Agelin-Chaab, Langis Roy, Julian Knutzen, Alexis Baltazar-y-Jimenez, Klaus Muenker:
Investigation of Automotive LiDAR Vision in Rain from Material and Optical Perspectives. Sensors 24(10): 2997 (2024) - 2021
- [j7]Behzad Yadegari, Langis Roy, Farhan A. Ghaffar:
A Versatile FG-MOSFET Inverter Design for X-Ray Radiation Dosimetry Applications. IEEE Trans. Biomed. Circuits Syst. 15(5): 1008-1016 (2021)
2010 – 2019
- 2012
- [j6]Muhammad Arsalan, Atif Shamim, Maitham Shams, Nicolas G. Tarr, Langis Roy:
Ultra Low Power CMOS-Based Sensor for On-Body Radiation Dose Measurements. IEEE J. Emerg. Sel. Topics Circuits Syst. 2(1): 34-41 (2012) - 2010
- [c2]Jose M. Gonzalez, Dominique Baillargeat, Langis Roy:
LTCC-based optically tunable microwave filter. CCECE 2010: 1-5
2000 – 2009
- 2008
- [j5]Peter H. R. Popplewell, Victor Karam, Atif Shamim, John W. M. Rogers, Langis Roy, Calvin Plett:
A 5.2-GHz BFSK Transceiver Using Injection-Locking and an On-Chip Antenna. IEEE J. Solid State Circuits 43(4): 981-990 (2008) - [j4]Atif Shamim, Muhammad Arsalan, Langis Roy, Maitham Shams, Nicolas G. Tarr:
Wireless Dosimeter: System-on-Chip Versus System-in-Package for Biomedical and Space Applications. IEEE Trans. Circuits Syst. II Express Briefs 55-II(7): 643-647 (2008) - 2006
- [c1]Atef Shamim, Peter H. R. Popplewell, Victor Karam, Langis Roy, John W. M. Rogers, Calvin Plett:
Silicon Differential Antenna/Inductor for Short Range Wireless Communication Applications. CCECE 2006: 94-97 - 2003
- [j3]Nicolas Gagnon, Jafar Shaker, Pierre Berini, Langis Roy, Aldo Petosa:
Material characterization using a quasi-optical measurement system. IEEE Trans. Instrum. Meas. 52(2): 333-336 (2003) - 2000
- [j2]Langis Roy, Jacques J. Rollin, Gianluca Arcari:
Measurement of IC package shielding effectiveness using an integrated antenna. IEEE Trans. Instrum. Meas. 49(2): 409-412 (2000)
1990 – 1999
- 1999
- [j1]Paul Béland, Langis Roy, Sylvain Labonté, Malcolm Stubbs:
An enhanced on-wafer millimeter-wave noise parameter measurement system. IEEE Trans. Instrum. Meas. 48(4): 825-829 (1999)
Coauthor Index
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