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ORCIDDimitris K. Papakostas
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Journal Articles
- 2010
[j5]Dimitris K. Papakostas, Alkis A. Hatzopoulos
:
Improved analogue fault coverage estimation using probabilistic analysis. Int. J. Circuit Theory Appl. 38(5): 503-514 (2010)- [j4]Michael G. Dimopoulos, Alexios Spyronasios, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alkis A. Hatzopoulos:
Circuit Implementation of a Supply Current Spectrum Test Method. IEEE Trans. Instrum. Meas. 59(10): 2660-2670 (2010) - 2008
- [j3]Dimitris K. Papakostas, Alkis A. Hatzopoulos:
A Unified Procedure for Fault Detection of Analog and Mixed-Mode Circuits Using Magnitude and Phase Components of the Power Supply Current Spectrum. IEEE Trans. Instrum. Meas. 57(11): 2589-2595 (2008) - 2006
- [j2]Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos:
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region. Microelectron. J. 37(11): 1313-1320 (2006) - 2003
- [j1]Dimitris K. Papakostas, Alkis A. Hatzopoulos:
Estimation of circuit output measurements including statistically dependent parameters. Int. J. Circuit Theory Appl. 31(2): 219-228 (2003)
Conference and Workshop Papers
- 2024
- [c11]Vassilios D. Vassios, Argyrios T. Hatzopoulos, Ioannis G. Intzes, Dimitrios K. Papakostas:
Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation. MOCAST 2024: 1-4 - 2023
- [c10]Vassilios D. Vassios, Argirios T. Hatzopoulos, Dimitrios K. Papakostas:
Improved Fault Detection of Analog Circuits by utilizing the Fundamental RMS of the Supply Current Fluctuation. MOCAST 2023: 1-6 - 2014
- [c9]Sotirios P. Pouros, Vassilios D. Vassios, Dimitrios K. Papakostas, Alkis A. Hatzopoulos:
Input stimulus comparison using an adaptive FPGA-based testing system. ISCAS 2014: 277-280 - 2010
- [c8]Michael G. Dimopoulos, Dimitris K. Papakostas, Basilios D. Vassios, Alkis A. Hatzopoulos:
Wavelet analysis of current measurements for mixed-signal circuit testing. ISCAS 2010: 1923-1926 - 2008
- [c7]Dimitrios K. Konstantinou, Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Alexios Spyronasios:
Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach. DDECS 2008: 251-254 - [c6]Michael G. Dimopoulos, Dimitris K. Papakostas, Alexios Spyronasios, Alkis A. Hatzopoulos, Dimitrios K. Konstantinou:
Power supply current testing in the production line of emergency luminaire circuits. ICECS 2008: 778-781 - 2007
- [c5]Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Evdokimos I. Konstantinidis, Alexios Spyronasios:
Design and development of a versatile testing system for analog and mixed-signal circuits. ECCTD 2007: 846-849 - [c4]Michael G. Dimopoulos, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alexios Spyronasios, Alkis A. Hatzopoulos:
Multiple Parametric Circuit Analysis Tool for Detectability Estimation. ICECS 2007: 1111-1114 - 2006
- [c3]Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos:
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region. ISCAS 2006 - 1996
- [c2]Dimitrios K. Papakostas, V. C. Kosmidis, Alkiviades A. Hatzopoulos:
Analog fault detectability based on statistical circuit analysis. ICECS 1996: 1076-1079 - 1994
- [c1]Dimitris K. Papakostas, Alkis A. Hatzopoulos:
Fault Detection in Linear Bipolar ICs: Comparative Results Between Power Supply Current and Output Voltage Measurements. ISCAS 1994: 61-64
Coauthor Index
aka: Alkiviades A. Hatzopoulos
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