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Alexios Spyronasios
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2010 – 2019
- 2011
- [j2]Alexios Spyronasios, Michael G. Dimopoulos, Alkis A. Hatzopoulos
:
Wavelet Analysis for the Detection of Parametric and Catastrophic Faults in Mixed-Signal Circuits. IEEE Trans. Instrum. Meas. 60(6): 2025-2038 (2011) - [c8]Alexios Spyronasios, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir:
On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study. Asian Test Symposium 2011: 365-370 - 2010
- [j1]Michael G. Dimopoulos, Alexios Spyronasios, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alkis A. Hatzopoulos
:
Circuit Implementation of a Supply Current Spectrum Test Method. IEEE Trans. Instrum. Meas. 59(10): 2660-2670 (2010) - [c7]Michael G. Dimopoulos, Alexios Spyronasios, Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos
:
Efficient testing of an optical feedback pixel driver using wavelet analysis. ICECS 2010: 1041-1044 - [c6]Michael G. Dimopoulos, Alexios Spyronasios, Alkis A. Hatzopoulos
:
Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits. IOLTS 2010: 83-87 - [c5]Alexios Spyronasios, Michael G. Dimopoulos, Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos
:
Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets. ISVLSI 2010: 232-237
2000 – 2009
- 2008
- [c4]Dimitrios K. Konstantinou, Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos
, Alexios Spyronasios:
Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach. DDECS 2008: 251-254 - [c3]Michael G. Dimopoulos, Dimitris K. Papakostas, Alexios Spyronasios, Alkis A. Hatzopoulos
, Dimitrios K. Konstantinou:
Power supply current testing in the production line of emergency luminaire circuits. ICECS 2008: 778-781 - 2007
- [c2]Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos
, Evdokimos I. Konstantinidis
, Alexios Spyronasios:
Design and development of a versatile testing system for analog and mixed-signal circuits. ECCTD 2007: 846-849 - [c1]Michael G. Dimopoulos, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alexios Spyronasios, Alkis A. Hatzopoulos
:
Multiple Parametric Circuit Analysis Tool for Detectability Estimation. ICECS 2007: 1111-1114
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