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Baojun Liu 0001

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affiliation: Air Force Engineering University, Xinyang, Henan, China

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2020 – today

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2024
[j5]
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Baojun Liu, Li Cai, Chuang Li:
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET. J. Electron. Test. 40(2): 159-169 (2024)
[j4]
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Baojun Liu, Xiaokuo Yang, Jing Zhu:
Variations of single event transient induced by line edge roughness (LER) and temperature in FinFET. Microelectron. J. 144: 106063 (2024)
2022
[j3]
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Baojun Liu, Li Cai:
Model and analysis of single event transient sensitivity based on uncertainty quantification. Microprocess. Microsystems 90: 104518 (2022)
2021
[j2]
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Baojun Liu, Cheng Li, Chuang Li, Shuang Zhang:
Effect of temperature and single event transient on crosstalk in coupled single-walled carbon nanotube (SWCNT) bundle interconnects. Int. J. Circuit Theory Appl. 49(10): 3408-3420 (2021)
2020
[j1]
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Baojun Liu, Li Cai, Xiaoqiang Liu:
An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits. J. Electron. Test. 36(4): 461-467 (2020)

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