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Indal Song

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affiliation: Samsung, Seoul, South Korea

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Journal Articles

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2018
[j2]
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  - journals/jssc/LeeLKHBCMLPLCCH18
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Chang-Kyo Lee, Junha Lee, Kiho Kim, Jin-Seok Heo, Jin-Hyeok Baek, Gil-Hoon Cha, Daesik Moon, Dong-Hun Lee, Jong-Wook Park, Seunseob Lee, Si-Hyeong Cho, Young-Ryeol Choi, Kyung-Soo Ha, Eunsung Seo, Youn-Sik Park, Seung-Jun Bae, Indal Song, Seok-Hun Hyun, Hyuck-Joon Kwon, Young-Soo Sohn, Jung-Hwan Choi, Kwang-Il Park, Seong-Jin Jang:
Dual-Loop Two-Step ZQ Calibration for Dynamic Voltage-Frequency Scaling in LPDDR4 SDRAM. IEEE J. Solid State Circuits 53(10): 2906-2916 (2018)
2013
[j1]
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Kyomin Sohn, Taesik Na, Indal Song, Yong Shim, Wonil Bae, Sanghee Kang, Dongsu Lee, Hangyun Jung, Seok-Hun Hyun, Hanki Jeoung, Ki Won Lee, Jun-Seok Park, Jongeun Lee, Byunghyun Lee, Inwoo Jun, Juseop Park, Junghwan Park, Hundai Choi, Sanghee Kim, Haeyoung Chung, Young Choi, Dae-Hee Jung, Byungchul Kim, Jung-Hwan Choi, Seong-Jin Jang, Chi-Wook Kim, Jung-Bae Lee, Joo-Sun Choi:
A 1.2 V 30 nm 3.2 Gb/s/pin 4 Gb DDR4 SDRAM With Dual-Error Detection and PVT-Tolerant Data-Fetch Scheme. IEEE J. Solid State Circuits 48(1): 168-177 (2013)

Conference and Workshop Papers

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2018
[c8]
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  - conf/asscc/MoonYCPKKCKLSHS18
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Joung-Wook Moon, Hye-Sung Yoo, Hundai Choi, Il-Won Park, Seok-Yong Kang, Jun-Bae Kim, Haeyoung Chung, Kiho Kim, Dong-Hun Lee, Ki-Jae Song, Seok-Hun Hyun, Indal Song, Young-Soo Sohn, Yong-Ho Cho, Jung-Hwan Choi, Kwang-Il Park, Seong-Jin Jang:
An Enhanced Built-off-Test Transceiver with Wide-range, Self-calibration Engine for 3.2 Gb/s/pin DDR4 SDRAM. A-SSCC 2018: 139-142
[c7]
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Jin-Hyeok Baek, Chang-Kyo Lee, Kiho Kim, Daesik Moon, Gil-Hoon Cha, Jin-Seok Heo, Min-Su Ahn, Dong-Ju Kim, Jae-Joon Song, Seokhong Kwon, Jongmin Kim, Kyung-Soo Kim, Jinoh Ahn, Jeong-Sik Nam, Byung-Cheol Kim, Jeong-Hyeon Cho, Jeonghoon Oh, Seung-Jun Bae, Indal Song, Seok-Hun Hyun, Ilgweon Kim, Hyuck-Joon Kwon, Young-Soo Sohn, Jung-Hwan Choi, Kwang-Il Park, Seong-Jin Jang:
A sub-0.85V, 6.4GBP/S/Pin TX-Interleaved Transceiver with Fast Wake-Up Time Using 2-Step Charging Control and VOHCalibration in 20NM DRAM Process. VLSI Circuits 2018: 147-148
2017
[c6]
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Chang-Kyo Lee, Junha Lee, Kiho Kim, Jin-Seok Heo, Gil-Hoon Cha, Jin-Hyeok Baek, Daesik Moon, Yoon-Joo Eom, Tae-Sung Kim, Hyunyoon Cho, Young Hoon Son, Seonghwan Kim, Jong-Wook Park, Sewon Eom, Si-Hyeong Cho, Young-Ryeol Choi, Seungseob Lee, Kyoung-Soo Ha, Youngseok Kim, Bo-Tak Lim, Dae-Hee Jung, Eungsung Seo, Kyoung-Ho Kim, Yoon-Gyu Song, Youn-Sik Park, Tae-Young Oh, Seung-Jun Bae, Indal Song, Seok-Hun Hyun, Joon-Young Park, Hyuck-Joon Kwon, Young-Soo Sohn, Jung-Hwan Choi, Kwang-Il Park, Seong-Jin Jang:
Dual-loop 2-step ZQ calibration for dedicated power supply voltage in LPDDR4 SDRAM. A-SSCC 2017: 153-156
[c5]
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Chang-Kyo Lee, Yoon-Joo Eom, Jin-Hee Park, Junha Lee, Hye-Ran Kim, Kihan Kim, Young Choi, Ho-Jun Chang, Jonghyuk Kim, Jong-Min Bang, Seungjun Shin, Hanna Park, Su-Jin Park, Young-Ryeol Choi, Hoon Lee, Kyong-Ho Jeon, Jae-Young Lee, Hyo-Joo Ahn, Kyoung-Ho Kim, Jung-Sik Kim, Soobong Chang, Hyong-Ryol Hwang, Duyeul Kim, Yoon-Hwan Yoon, Seok-Hun Hyun, Joon-Young Park, Yoon-Gyu Song, Youn-Sik Park, Hyuck-Joon Kwon, Seung-Jun Bae, Tae-Young Oh, Indal Song, Yong-Cheol Bae, Jung-Hwan Choi, Kwang-Il Park, Seong-Jin Jang, Gyo-Young Jin:
23.2 A 5Gb/s/pin 8Gb LPDDR4X SDRAM with power-isolated LVSTL and split-die architecture with 2-die ZQ calibration scheme. ISSCC 2017: 390-391
2016
[c4]
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Hyunui Lee, Sukyong Kang, Hye-Seung Yu, Won-Joo Yun, Jae-Hun Jung, Sungoh Ahn, Wang-Soo Kim, Beomyong Kil, Yoo-Chang Sung, Sang-Hoon Shin, Yong-Sik Park, Yong-Hwan Kim, Kyung-Woo Nam, Indal Song, Kyomin Sohn, Yong-Cheol Bae, Jung-Hwan Choi, Seong-Jin Jang, Gyo-Young Jin:
Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM). A-SSCC 2016: 169-172
2015
[c3]
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Won-Joo Yun, Indal Song, Hanki Jeoung, Hundai Choi, Seok-Ho Lee, Jun-Bae Kim, Chi-Wook Kim, Jung-Hwan Choi, Seong-Jin Jang, Joo-Sun Choi:
17.7 A digital DLL with hybrid DCC using 2-step duty error extraction and 180° phase aligner for 2.67Gb/S/pin 16Gb 4-H stack DDR4 SDRAM with TSVs. ISSCC 2015: 1-3
2014
[c2]
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Reum Oh, Byunghyun Lee, Sang-Woong Shin, Wonil Bae, Hundai Choi, Indal Song, Yun-Sang Lee, Jung-Hwan Choi, Chi-Wook Kim, Seong-Jin Jang, Joo-Sun Choi:
Design technologies for a 1.2V 2.4Gb/s/pin high capacity DDR4 SDRAM with TSVs. VLSIC 2014: 1-2
2012
[c1]
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  - conf/isscc/SohnNSSBKLJJLPLLJPPCKCCJCMCKJCO12
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Kyomin Sohn, Taesik Na, Indal Song, Yong Shim, Wonil Bae, Sanghee Kang, Dongsu Lee, Hangyun Jung, Hanki Jeoung, Ki Won Lee, Junsuk Park, Jongeun Lee, Byunghyun Lee, Inwoo Jun, Juseop Park, Junghwan Park, Hundai Choi, Sanghee Kim, Haeyoung Chung, Young Choi, Dae-Hee Jung, Jang Seok Choi, Byung-Sick Moon, Jung-Hwan Choi, Byungchul Kim, Seong-Jin Jang, Joo-Sun Choi, Kyungseok Oh:
A 1.2V 30nm 3.2Gb/s/pin 4Gb DDR4 SDRAM with dual-error detection and PVT-tolerant data-fetch scheme. ISSCC 2012: 38-40

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