"Electrical Field Test Method of Resistive Open Defects between Dies by ..."

Hanna Soneda et al. (2019)

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DOI: 10.1109/3DIC48104.2019.9058777

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-19

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Hanna Soneda, Masaki Hashizume, Hiroyuki Yotsuyanagi, Shyue-Kung Lu:
Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes. 3DIC 2019: 1-5

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