"T-MDML: Triplet-based Multiple Distance Metric Learning for Multi-Instance ..."

Dongyeon Kim, Yejin Kan, Gangman Yi (2025)

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DOI: 10.1609/AAAI.V39I17.33963

access: open

type: Conference or Workshop Paper

metadata version: 2025-04-17

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Dongyeon Kim, Yejin Kan, Gangman Yi:
T-MDML: Triplet-based Multiple Distance Metric Learning for Multi-Instance Multi-Label Classification with Label Correlation. AAAI 2025: 17850-17858

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