"Transient Force Atomic Force Microscopy: A New Nano-Interrogation Method."

Deepak R. Sahoo, Pranav Agarwal, Murti V. Salapaka (2007)

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DOI: 10.1109/ACC.2007.4283047

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-30

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Deepak R. Sahoo, Pranav Agarwal, Murti V. Salapaka:
Transient Force Atomic Force Microscopy: A New Nano-Interrogation Method. ACC 2007: 2135-2140

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