"An Effective Architecture of Memory Built-In Self-Test for Wide Range of SRAM."

Tin Quang Bui et al. (2016)

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DOI: 10.1109/ACOMP.2016.026

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/acomp/BuiPNNLH16
Tin Quang Bui, Lam Dang Pham, Hieu Minh Nguyen, Viet Thai Nguyen, Thong Chi Le, Trang Hoang:
An Effective Architecture of Memory Built-In Self-Test for Wide Range of SRAM. ACOMP 2016: 121-124

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