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"A method of automatic fault-detection test generation for four-phase MOS ..."

Y. T. Yen (1969)

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DOI: 10.1145/1476793.1476829

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Y. T. Yen:
A method of automatic fault-detection test generation for four-phase MOS LSI circuits. AFIPS Spring Joint Computing Conference 1969: 215-220

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