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"Two-degree-of-freedom control combining machine learning and extremum ..."

Michael Maiworm et al. (2018)

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DOI: 10.23919/ACC.2018.8431022

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  - conf/amcc/Maiworm0TTF18
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Michael Maiworm, Christian Wagner, Ruslan Temirov, F. Stefan Tautz, Rolf Findeisen:
Two-degree-of-freedom control combining machine learning and extremum seeking for fast scanning quantum dot microscopy. ACC 2018: 4360-4366

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