"Closing the Defect Reduction Gap Between Software Inspection and ..."

Jerod W. Wilkerson (2007)

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type: Conference or Workshop Paper

metadata version: 2021-09-05

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Jerod W. Wilkerson:
Closing the Defect Reduction Gap Between Software Inspection and Test-Driven Development: Applying Mutation Analysis to Iterative Test-First Programming. AMCIS 2007: 389

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