"A Radiation-Hardened Serial Peripheral Interface with an ECC-Protected ..."

Ming-Hao Chang et al. (2024)

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DOI: 10.1109/APCCAS62602.2024.10808843

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-13

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Ming-Hao Chang, Chansyun Yang, Yu-Ju Chuang, Herming Chiueh:
A Radiation-Hardened Serial Peripheral Interface with an ECC-Protected SRAM in a 65nm CMOS Technology. APCCAS 2024: 217-220

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