"Quality Assurance for ML Devices A Risk-Based Approach."

Gonzalo Aguirre Dominguez, Keigo Kawaai, Hiroshi Maruyama (2023)

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DOI: 10.1109/APSEC60848.2023.00064

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-10

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Gonzalo Aguirre Dominguez, Keigo Kawaai, Hiroshi Maruyama:
Quality Assurance for ML Devices A Risk-Based Approach. APSEC 2023: 524-531

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