"Analysis of Switching Characteristics of Wide SOA and High Reliability 100 ..."

Anna Kuwana, Jun-Ichi Matsuda, Haruo Kobayashi (2021)

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DOI: 10.1109/ASICON52560.2021.9620319

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-06

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Anna Kuwana, Jun-Ichi Matsuda, Haruo Kobayashi:
Analysis of Switching Characteristics of Wide SOA and High Reliability 100 V N-LDMOS Transistor with Dual RESURF and Grounded Field Plate Structure. ASICON 2021: 1-4

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