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"Auxiliary testability design schemes for CMOS DACs with ultrahigh sampling ..."

Bao Li, Long Zhao, Yuhua Cheng (2017)

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DOI: 10.1109/ASICON.2017.8252405

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-08

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Bao Li, Long Zhao, Yuhua Cheng:
Auxiliary testability design schemes for CMOS DACs with ultrahigh sampling rates. ASICON 2017: 36-39

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