"A new scheme for testability improvement of ECC incorporated memory."

Lei Wang et al. (2011)

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DOI: 10.1109/ASICON.2011.6157166

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Lei Wang, Jianhua Jiang, Yumei Zhou, Gaofeng Ren:
A new scheme for testability improvement of ECC incorporated memory. ASICON 2011: 240-243

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