"TCI Tester: Tester for Through Chip Interface."

Hideto Kayashima, Hideharu Amano (2021)

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DOI: 10.1145/3394885.3431660

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-09

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Hideto Kayashima, Hideharu Amano:
TCI Tester: Tester for Through Chip Interface. ASP-DAC 2021: 103-104

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