"Design of Aging-Robust Clonable PUF Using an Insulator-Based ReRAM for ..."

Kunihiro Oshima, Kazunori Kuribara, Takashi Sato (2024)

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DOI: 10.1109/ASP-DAC58780.2024.10473868

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-22

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Kunihiro Oshima, Kazunori Kuribara, Takashi Sato:
Design of Aging-Robust Clonable PUF Using an Insulator-Based ReRAM for Organic Circuits. ASPDAC 2024: 165-170

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