"Automatic Test Generation for Linear Analog Circuits under Parameter ..."

C.-J. Richard Shi, Michael W. Tian (1998)

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type: Conference or Workshop Paper

metadata version: 2013-04-30

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C.-J. Richard Shi, Michael W. Tian:
Automatic Test Generation for Linear Analog Circuits under Parameter Variations. ASP-DAC 1998: 501-506

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