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"Simultaneous Control of Subthreshold and Gate Leakage Current in ..."

Youngsoo Shin et al. (2007)

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DOI: 10.1109/ASPDAC.2007.358061

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/aspdac/ShinHKC07
Youngsoo Shin, Sewan Heo, Hyung-Ock Kim, Jung Yun Choi:
Simultaneous Control of Subthreshold and Gate Leakage Current in Nanometer-Scale CMOS Circuits. ASP-DAC 2007: 654-659

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