"A cost effective test screening method on 40-nm 4-Mb embedded SRAM for ..."

Yoshisato Yokoyama et al. (2015)

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DOI: 10.1109/ASSCC.2015.7387483

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Yoshisato Yokoyama, Yuichiro Ishii, Toshihiro Inada, Koji Tanaka, Miki Tanaka, Yoshiki Tsujihashi, Koji Nii:
A cost effective test screening method on 40-nm 4-Mb embedded SRAM for low-power MCU. A-SSCC 2015: 1-4

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