"Design for Two-Pattern Testability of Controller-Data Path Circuits."

Atlaf Ul Amin, Satoshi Ohtake, Hideo Fujiwara (2002)

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DOI: 10.1109/ATS.2002.1181689

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Atlaf Ul Amin, Satoshi Ohtake, Hideo Fujiwara:
Design for Two-Pattern Testability of Controller-Data Path Circuits. Asian Test Symposium 2002: 73-79

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