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"Impact of Resistive-Bridge Defects in TAS-MRAM Architectures."

Joao Azevedo et al. (2012)

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DOI: 10.1109/ATS.2012.37

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/AzevedoVBDGTPAM12
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  persistent URL:
  - https://dblp.org/rec/conf/ats/AzevedoVBDGTPAM12
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay:
Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. Asian Test Symposium 2012: 125-130

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