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"Impact of Resistive-Bridge Defects in TAS-MRAM Architectures."
Joao Azevedo et al. (2012)
- Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay:
Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. Asian Test Symposium 2012: 125-130
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