"Multi-histogram ADC BIST System for ADC Linearity Testing."

Koay Soon Chan et al. (2013)

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DOI: 10.1109/ATS.2013.47

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Koay Soon Chan, Nuzrul Fahmi Nordin, Kim Chon Chan, Terk Zyou Lok, Chee Wai Yong:
Multi-histogram ADC BIST System for ADC Linearity Testing. Asian Test Symposium 2013: 213-214

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