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"High speed IDDQ test and its testability for process variation."
Masaki Hashizume et al. (2000)
- Masaki Hashizume, Hiroyuki Yotsuyanagi, Masahiro Ichimiya, Takeomi Tamesada, Masashi Takeda:
High speed IDDQ test and its testability for process variation. Asian Test Symposium 2000: 344-349
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