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"Partitioning and Reordering Techniques for Static Test Sequence Compaction ..."

Michael S. Hsiao, Srimat T. Chakradhar (1998)

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DOI: 10.1109/ATS.1998.741656

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Michael S. Hsiao, Srimat T. Chakradhar:
Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits. Asian Test Symposium 1998: 452-457

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