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"The Application of BIST-Aided Scan Test for Real Chips."

Hideaki Konishi, Michiaki Emori, Takahisa Hiraide (2006)

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DOI: 10.1109/ATS.2006.261009

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-07

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  dblp key:
  - conf/ats/KonishiEH06
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Hideaki Konishi, Michiaki Emori, Takahisa Hiraide:
The Application of BIST-Aided Scan Test for Real Chips. ATS 2006: 131

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