"On-Chip Test Generation Mechanism for Scan-Based Two-Pattern Tests."

Nan-Cheng Lai, Sying-Jyan Wang (2008)

Details and statistics

DOI: 10.1109/ATS.2008.46

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics