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ORCID"Invalid State Identification for Sequential Circuit Test Generation."
Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen (1996)
- Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen:
Invalid State Identification for Sequential Circuit Test Generation. Asian Test Symposium 1996: 10-15
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