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ORCID"A Scan Matrix Design for Low Power Scan-Based Test."
Shih Ping Lin, Chung-Len Lee, Jwu E. Chen (2005)
- Shih Ping Lin, Chung-Len Lee, Jwu E. Chen:
A Scan Matrix Design for Low Power Scan-Based Test. Asian Test Symposium 2005: 224-229
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