"PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for ..."

Yi-Tsung Lin, Meng-Fan Wu, Jiun-Lang Huang (2008)

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DOI: 10.1109/ATS.2008.63

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yi-Tsung Lin, Meng-Fan Wu, Jiun-Lang Huang:
PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment. ATS 2008: 391-396

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