"TOF: a tool for test pattern generation optimization of an FPGA ..."

Michel Renovell et al. (2000)

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DOI: 10.1109/ATS.2000.893644

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Michel Renovell, Jean-Michel Portal, Penelope Faure, Joan Figueras, Yervant Zorian:
TOF: a tool for test pattern generation optimization of an FPGA application oriented test. Asian Test Symposium 2000: 323-328

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