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"Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous ..."

Hiroshi Takahashi et al. (2004)

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DOI: 10.1109/ATS.2004.41

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ats/TakahashiYHT04
Hiroshi Takahashi, Yukihiro Yamamoto, Yoshinobu Higami, Yuzo Takamatsu:
Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set. Asian Test Symposium 2004: 216-221

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