"Top 5 Issues in Practical Testing of High-Speed Interface Devices."

Takahiro J. Yamaguchi (2007)

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DOI: 10.1109/ATS.2007.122

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

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Takahiro J. Yamaguchi:
Top 5 Issues in Practical Testing of High-Speed Interface Devices. ATS 2007: 519

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