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"An On-Chip Integrator Leakage Characterization Technique and Its ..."

Chen-Yuan Yang, Xuan-Lun Huang, Jiun-Lang Huang (2009)

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DOI: 10.1109/ATS.2009.55

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
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Chen-Yuan Yang, Xuan-Lun Huang, Jiun-Lang Huang:
An On-Chip Integrator Leakage Characterization Technique and Its Application to Switched Capacitor Circuits Testing. Asian Test Symposium 2009: 367-372

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