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"Automated Particle Picking in Cryo-Electron Micrographs using Deep Regression."

Nguyen P. Nguyen et al. (2018)

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DOI: 10.1109/BIBM.2018.8621224

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  dblp key:
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Nguyen P. Nguyen, Ilker Ersoy, Tommi A. White, Filiz Bunyak:
Automated Particle Picking in Cryo-Electron Micrographs using Deep Regression. BIBM 2018: 2453-2460

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