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"Estimation of Drain-Induced Barrier Lowering Variation Due to Random ..."
Weifeng Lyu et al. (2023)
- Weifeng Lyu, Ying Han, Caiyun Zhang, Weijie Wei, Dengke Chen:
Estimation of Drain-Induced Barrier Lowering Variation Due to Random Dopant Fluctuation Effect in Nanometer MOSFETs by Gamma Distribution. CECNet 2023: 215-223
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