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"Process variation in nano-scale memories: failure analysis and process ..."

Amit Agarwal, Bipul C. Paul, Kaushik Roy (2004)

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DOI: 10.1109/CICC.2004.1358819

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-17

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Amit Agarwal, Bipul C. Paul, Kaushik Roy:
Process variation in nano-scale memories: failure analysis and process tolerant architecture. CICC 2004: 353-356

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