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"Comparative low frequency noise analysis of bipolar and MOS transistors ..."

Jeffrey A. Babcock et al. (2001)

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DOI: 10.1109/CICC.2001.929806

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-10

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Jeffrey A. Babcock, Bill Loftin, Praful Madhani, Xinfen Chen, Angelo Pinto, Dieter K. Schroder:
Comparative low frequency noise analysis of bipolar and MOS transistors using an advanced complementary BiCMOS technology. CICC 2001: 385-388

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