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"Challenge: variability characterization and modeling for 65- to 90-nm ..."
Hiroo Masuda et al. (2005)
- Hiroo Masuda, Shin-ichi Ohkawa, Atsushi Kurokawa, Masakazu Aoki:
Challenge: variability characterization and modeling for 65- to 90-nm processes. CICC 2005: 593-599
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