"Improving SRAM Vmin and yield by using variation-aware BTI stress."

Jiajing Wang et al. (2010)

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DOI: 10.1109/CICC.2010.5617631

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-31

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Jiajing Wang, Satyanand Nalam, Zhenyu Qi, Randy W. Mann, Mircea R. Stan, Benton H. Calhoun:
Improving SRAM Vmin and yield by using variation-aware BTI stress. CICC 2010: 1-4

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