"vRM: Verifying Reference Monitors via Exhaustive Access Pattern Generation."

Ryo Nakashima, Takahiro Shinagawa (2025)

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DOI: 10.1109/COMPSAC65507.2025.00137

access: closed

type: Conference or Workshop Paper

metadata version: 2025-09-05

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Ryo Nakashima, Takahiro Shinagawa:
vRM: Verifying Reference Monitors via Exhaustive Access Pattern Generation. COMPSAC 2025: 1057-1066

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